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                                                                 JEOL JAMP 10
                                                            
(Auger Spectrometer )

 
 

 

AUGER ELECTRON SPECTROSCOPY (AES)

JEOL JAMP 10 SCANNING AUGER MICROPROBE WITH SEAL LABORATORIES CUSTOM DATA PROCESSING SYSTEM:

* Detects all elements above helium

* 50nm spatial resolution

* Elemental depth profiling

* Elemental distribution "mapping"
 
* Concentration line scans

* Versatile image acquisition capabilities

* Improved handling of electrically insulated samples

 
                   
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