It is also possible to map the elements found in an SEM image by X-ray analysis. By setting windows around the peaks of specific elements, the software can scan the sample and create digital images or maps of each element. By placing dots on the screen when an X-ray count of the particular element is received, an image is formed that mimics the SEM image, except the contrast is formed by the elemental X-ray emission.

The following example is a cross section through a lead/tin solder joint on a nickel plated copper lead wire.

SEM Image 2500X

The software also allows the combination of these elemental maps. For example, the following is a combination of the nickel, lead, and tin maps.

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