Scanning Electron Microscope

JEOL 6100

Scanning Electron Microscope JEOL 6100 - Seal LaboratoriesSEM:

  • 40 Angstroms Resolution
  • Advanced TV Rate Backscattered Electron Detector
  • Large Sample Chamber (Can Accomodate 8" x 8" x 1" Sample)
  • Orion digital imaging system

EDX:

  • SuperQuantum ultra-thin window Detector For Simultaneous Analysis of Boron Through Uranium
  • Quantitative Analysis With or Without Standards
  • Line Scans and X-ray "dot" maps
  • Advanced image analysis system
  • PC based IXRF Iridium system
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