JavaScript Menu, DHTML Menu Powered By Milonic
Home Areas of Expertise Instrumentation SEM
Today: , ,
 
 

                                                           JEOL 6100
                                              
(Scanning Electron Microscope)

 

 

 
SEM:
* 40 Angstroms Resolution
* Advanced TV Rate Backscattered Electron Detector
* Large Sample Chamber (Can Accomodate 8" x 8" x 1"    Sample)
* Orion digital imaging system
EDX:
* SuperQuantum ultra-thin window Detector For Simultaneous    Analysis of Boron Through Uranium
* Quantitative Analysis With or Without Standards
* Line Scans and X-ray "dot" maps
* Advanced image analysis system
* PC based IXRF Iridium system

 

 
                 
Contact Us | Site Map