JavaScript Menu, DHTML Menu Powered By Milonic
Home Areas of Expertise Instrumentation SEM
Today: , ,
 
     

                                                           JEOL 6400
                                              
(Scanning Electron Microscope)

 

 

 

SEM:
* 30 Angstroms Resolution
* Advanced TV Rate Backscattered Electron Detector
* Voltage Contrast and EBIC
* Rapid Sample Interchange
* Orion digital imaging system
EDX:

* SuperQuantum ultra-thin window Detector For Simultaneous    Analysis of Boron Through Uranium
* Quantitative Analysis With or Without Standards

* Line Scans and X-ray "dot" maps

* Advanced image analysis system

* PC based IXRF Iridium system


 
                 
Contact Us | Site Map